- 国際会議論文
Eiji Hase, Takeshi Yasui, Hirayama Hideki and Kentaro Nagamatsu, “The improving resolution for dislocation analysis in GaN by three-photon microscopy”, in Photonics West 2020: OPTO2020, Feb.5, 2020 (Feb.4-6, 2020/San Francisco, USA).
Eiji Hase, Takeshi Yasui, Hirayama Hideki and Kentaro Nagamatsu, “The improving resolution for dislocation analysis in GaN by three-photon microscopy”, in Photonics West 2020: OPTO2020, Feb.5, 2020 (Feb.4-6, 2020/San Francisco, USA).